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Mari Juel

Seniorforsker

Mari Juel

Seniorforsker

Mari Juel
Telefon: 982 43 931
Mobil: 982 43 931
Avdeling: Bærekraftig energiteknologi
Kontorsted: Trondheim

Publikasjoner og ansvarsområder

Publikasjoner

Publikasjon

Identification of defects causing performance degradation of high temperature n-type Czochralski silicon bifacial solar cells

http://www.sintef.no/publikasjoner/publikasjon/?pubid=CRIStin+1375936

Four industrial-scale n-type Czochralski silicon crystals were grown with different impurity contents, i.e. metallics, phosphorus and oxygen. Horizontal slices were obtained from the top and middle of the crystals and were characterized in terms of lifetime and both defect and impurity distribution....

Forfattere Gaspar Guilherme Manuel Morais Coletti Gianluca Juel Mari Würzner Sindy Søndenå Rune Di Sabatino Marisa Arnberg Lars Øvrelid Eivind Johannes
År 2016
Type Tidsskriftsartikkel
Publikasjon

Influence of grown-in defects on final oxygen precipitates during heat treatment of Cz-Si wafer analyzed by a coupled model with the interaction of point defects, oxygen precipitates, and dislocation loops

http://www.sintef.no/publikasjoner/publikasjon/?pubid=CRIStin+1375141

To illuminate the role of crystal growth process on final oxygen precipitates during heat treatment of Cz-Si wafer, a coupled model, including the interaction of oxygen precipitates, point defects, and dislocation loops, has been used to test the influence of grown-in defects generated during crysta...

År 2016
Type Tidsskriftsartikkel
Publikasjon

Boron liquid solution deposited by spray method for p-type emitter formation in crystalline Si solar cells

http://www.sintef.no/publikasjoner/publikasjon/?pubid=CRIStin+1453955

This paper reports the fabrication of n-type crystalline Si based solar cell using boron liquid solution (BLS) deposited by spray method for p-type emitter formation. The X-ray photoelectron spectroscopy (XPS) was used for the analysis of surface composition and electronic states of elements at the ...

Forfattere Panek Piotr Swatowska Barbara Dawidowski Wojciech Juel Mari Zięba Pawel
År 2016
Type Tidsskriftsartikkel
Publikasjon

On the shape of n-type Czochralski silicon top ingots

http://www.sintef.no/publikasjoner/publikasjon/?pubid=CRIStin+1250286

Industrial scale n-type monocrystalline silicon ingots with different crown shape and shouldering area have been grown and characterized in terms of minority carrier lifetime, resistivity and concentration and distribution of interstitial oxygen (Oi), voids and thermal donors (TD). The properties ha...

Forfattere Gaspar Guilherme Manuel Morais Juel Mari Søndenå Rune Pascoa Soraia Sofia Di Sabatino Marisa Arnberg Lars Øvrelid Eivind Johannes
År 2015
Type Tidsskriftsartikkel
Publikasjon

Study of evolution of dislocation clusters in high performance multicrystalline silicon

http://www.sintef.no/publikasjoner/publikasjon/?pubid=CRIStin+1213937

The evolution of dislocation clusters in High Performance Multicrystalline Silicon was studied by means of photoluminescence imaging, defect etching and Electron Backscatter Diffraction. Cluster height was found to increase as function of lateral size. The largest clusters were found to exist in twi...

Forfattere Stokkan Gaute Hu Yu Mjøs Øyvind Juel Mari
År 2014
Type Tidsskriftsartikkel
Publikasjon

Investigating the effect of carbon on oxygen behavior in n-type Czochralski silicon for PV application

http://www.sintef.no/publikasjoner/publikasjon/?pubid=CRIStin+1197912

The objective of the current work was to understand the effect of carbon as an impurity in silicon in terms of the formation of as-grown oxygen defects and the subsequent behavior of these defects in n-type Czochralski (Cz) silicon during heat treatment. Three n-type Cz ingots with different carbon ...

År 2014
Type Tidsskriftsartikkel
Publikasjon

Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection

http://www.sintef.no/publikasjoner/publikasjon/?pubid=CRIStin+1026971

Oxygen induced stacking faults (OSFs) are mainly seen in oxygen rich wafers from the seed end of Cz-silicon crystals. In wafers this ring shaped OSF-region delineates a border between two defect regions; usually silicon self-interstitials dominate outside and vacancies inside this ring. High tempera...

Forfattere Søndenå Rune Hu Yu Juel Mari Wiig Marie Syre Angelskår Hallvard
År 2013
Type Tidsskriftsartikkel
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