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Mari Juel

Seniorforsker

Mari Juel

Seniorforsker

Mari Juel
Telefon: 982 43 931
Mobil: 982 43 931
Avdeling: Bærekraftig energiteknologi
Kontorsted: Trondheim

Publikasjoner og ansvarsområder

Publikasjoner

Publikasjon

On the shape of n-type Czochralski silicon top ingots

http://www.sintef.no/publikasjoner/publikasjon/?pubid=CRIStin+1250286

Industrial scale n-type monocrystalline silicon ingots with different crown shape and shouldering area have been grown and characterized in terms of minority carrier lifetime, resistivity and concentration and distribution of interstitial oxygen (Oi), voids and thermal donors (TD). The properties ha...

Forfattere Gaspar Guilherme Manuel Morais Juel Mari Søndenå Rune Pascoa Soraia Sofia Di Sabatino Marisa Arnberg Lars Øvrelid Eivind Johannes
År 2015
Type Tidsskriftsartikkel
Publikasjon

Investigating the effect of carbon on oxygen behavior in n-type Czochralski silicon for PV application

http://www.sintef.no/publikasjoner/publikasjon/?pubid=CRIStin+1197912

The objective of the current work was to understand the effect of carbon as an impurity in silicon in terms of the formation of as-grown oxygen defects and the subsequent behavior of these defects in n-type Czochralski (Cz) silicon during heat treatment. Three n-type Cz ingots with different carbon ...

Forfattere Zhang Song Juel Mari Øvrelid Eivind Johannes Tranell Gabriella
År 2014
Type Tidsskriftsartikkel
Publikasjon

Study of evolution of dislocation clusters in high performance multicrystalline silicon

http://www.sintef.no/publikasjoner/publikasjon/?pubid=CRIStin+1213937

The evolution of dislocation clusters in High Performance Multicrystalline Silicon was studied by means of photoluminescence imaging, defect etching and Electron Backscatter Diffraction. Cluster height was found to increase as function of lateral size. The largest clusters were found to exist in twi...

Forfattere Stokkan Gaute Hu Yu Mjøs Øyvind Juel Mari
År 2014
Type Tidsskriftsartikkel
Publikasjon

Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection

http://www.sintef.no/publikasjoner/publikasjon/?pubid=CRIStin+1026971

Oxygen induced stacking faults (OSFs) are mainly seen in oxygen rich wafers from the seed end of Cz-silicon crystals. In wafers this ring shaped OSF-region delineates a border between two defect regions; usually silicon self-interstitials dominate outside and vacancies inside this ring. High tempera...

Forfattere Søndenå Rune Hu Yu Juel Mari Wiig Marie Syre Angelskår Hallvard
År 2013
Type Tidsskriftsartikkel
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