Ingvild is a senior scientist at SINTEF and a researcher (20%) in the Semiconductor Physics group at the University of Oslo. She specializes in materials characterization and has ~15 years’ experience with X-ray photoelectron spectroscopy (XPS). Currently she is the PI of a FRIPRO-Young Research Talent project focusing on interface engineering of Ga2O3 thin films for power electronics. She also works closely with local battery materials developers in more applied projects.
Education
2013 - PhD:
The Department of Physics, University of Oslo (UiO), Norway.
Methods: X-ray photoelectron spectroscopy (XPS) and Density functional theory calculations (DFT).
Title: "Combined experimental and computational study of the meta-stable Mg-Ti-H system."
2006 - Master:
Department of Physics, UiO and Institute for Energy Technology (IFE), Norway
Methods: Powder X-ray and neutron diffraction (including synchrotron@ESRF), Rietveld refinement, desorption spectroscopy, arc melting.
Title: "Structural studies of hydrides of Zr2Cu, Zr2Pd and LaPtIn."
Competence and research areas
XPS is a versatile technique for investigation of materials surfaces. Both chemical properties (quantification of elements, identification of chemical phases) and electronic properties (bandstructure in semiconductors) can be investigated. Ingvild has broad experience with both academic research and development and innovation projects in collaboration with Norwegian companies. Current and past projects include materials for photo catalysis, photovoltaics, battery electrodes, hydrogen storage, construction materials, sensors and electronic components. Her activity also includes experiments at international large-scale synchrotron facilities, in particular "operando" XPS, i.e., measurements at realistic/operating conditions (in gas/liquid, controlled temperature, under electric bias).
