Characterization techniques
A more detailed description of our materials characterisation infrastructure
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Characterization techniques:
Light microscopy (LM)
- Macroscope
- Light Transmission Microscopy
- Light Reflection Microscopy
Electron microscopy
- Scanning Electron Microscopy (SEM)
- Transmission (TEM) and Scanning Transmission Electron Microscopy (S-TEM)
Compositional and chemical surface analysis
Surface morphology and topography
- White Light Interferometry (WLI)
- Atomic Force Microscopy (AFM)
- Bulk chemical composition measurements
- Energy Dispersive Spectroscopy (EDS) in SEM and (S-)TEM
- Sample preparation
Sample cutting, wheels, polishing instruments, cryo-milling
