Scanning Kelvin Probe Force Microscopy (SKPFM) applied to various conversion coatings

Author(s)

• Bjørn Steinar Tanem
• Otto Lunder
• Ole Øystein Knudsen

Affiliation

• SINTEF Industry / Materials and Nanotechnology
• SINTEF Industry / Biotechnology and Nanomedicine
• SINTEF Industry / Process Technology

Issue

45