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Optimizing AMAN-SMAN-DMAN at Hamburg and Arlanda airport

Abstract

The Third SESAR Innovation Days (SIDs), At Royal Institute of Technology in Stockholm, Sweden, Volume: 3

Category

Academic chapter/article/Conference paper

Language

English

Author(s)

Affiliation

  • SINTEF Digital / Mathematics and Cybernetics

Year

2011

Publisher

Eurocontrol

Book

Proceedings of the SESAR Innovation Days

ISBN

978-2-87497-024-5

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