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Numerical analysis of dislocation density and residual stress in a GaN single crystal during the cooling process

Category

Academic lecture

Language

English

Author(s)

  • Satoshi Nakano
  • Bing Gao
  • Koichi Kakimoto

Affiliation

  • Unknown
  • SINTEF Industry / Metal Production and Processing

Presented at

the 18th International Conference on Crystal Growth and Epitaxy (ICCGE-18)

Date

07.08.2016 - 12.08.2016

Year

2016

View this publication at Cristin