Characterisation of Beam Sensitive Quartz by Scanning TEM
Category
Poster
Client
- NORTEM / 197405
Language
English
Author(s)
- Jochen Busam
- Sigurd Wenner
- Astrid Marie Muggerud
- Antonius Van Helvoort
Affiliation
- Norwegian University of Science and Technology
- SINTEF Industry / Materials and Nanotechnology
- Unknown
Presented at
Scandem 2018
Place
Copenhagen
Date
25.06.2018 - 28.06.2018
Organizer
CEN-DTU/Scandem