Microelectronics Technologies Scaling and Reliability A Comparison Study for High Temperature and Radiation Hard Applications
Category
Academic article
Language
English
Author(s)
- Ovidiu Vermesan
- Lars-Cyril Blystad
- Hanne Grindvoll
- Geir Uri Jensen
- Berit Sundby Avset
Affiliation
- SINTEF Digital / Sustainable Communication Technologies
- University of South-Eastern Norway
- SINTEF Digital / Smart Sensors and Microsystems
- Unknown
Year
2001Published in
HiTEN
ISSN
2380-4491