Layout Techniques Used to Reduce the Leakage Currents in ASIC Design for High Temperature Applications
Category
Academic article
Language
English
Author(s)
- Ovidiu Vermesan
- Lars-Cyril Blystad
- Hanne Grindvoll
Affiliation
- SINTEF Digital / Sustainable Communication Technologies
- University of South-Eastern Norway
Year
2003Published in
HiTEN
ISSN
2380-4491