Fast and Accurate Deep Learning Framework for Secure Fault Diagnosis in the Industrial Internet of Things
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Category
Academic article
Language
English
Author(s)
- Youcef Djenouri
- Asma Belhadi
- Gautam Srivastava
- Uttam Ghosh
- Pushpita Chatterjee
- Jerry Chun-Wei Lin
Affiliation
- SINTEF Digital / Mathematics and Cybernetics
- Kristiania University College
- China Medical University School of Medicine
- Brandon University
- Vanderbilt University
- Ton Duc Thang University
- Western Norway University of Applied Sciences
Year
2021Published in
IEEE Internet of Things Journal
ISSN
2327-4662
Publisher
IEEE (Institute of Electrical and Electronics Engineers)
Volume
10
Issue
4
Page(s)
2802 - 2810