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Fast and Accurate Deep Learning Framework for Secure Fault Diagnosis in the Industrial Internet of Things

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Category

Academic article

Language

English

Author(s)

  • Youcef Djenouri
  • Asma Belhadi
  • Gautam Srivastava
  • Uttam Ghosh
  • Pushpita Chatterjee
  • Jerry Chun-Wei Lin

Affiliation

  • SINTEF Digital / Mathematics and Cybernetics
  • Kristiania University College
  • China Medical University School of Medicine
  • Brandon University
  • Vanderbilt University
  • Ton Duc Thang University
  • Western Norway University of Applied Sciences

Year

2021

Published in

IEEE Internet of Things Journal

ISSN

2327-4662

Publisher

IEEE (Institute of Electrical and Electronics Engineers)

Volume

10

Issue

4

Page(s)

2802 - 2810

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