EBSD analyses of metallic, ceramic, semiconductor and geological specimens in a table top SEM
Category
Academic lecture
Language
English
Author(s)
- Jarle Hjelen
- Wilhelm Dall
- Håkon Wiik Ånes
- Sasha Vuckovic
- Torbjørn Sunde
- Kurt Aasly
Affiliation
- Norwegian University of Science and Technology
- SINTEF Industry / Metal Production and Processing
- Unknown
Presented at
European Microscopy Congress 2020
Place
Copenhagen
Date
24.11.2020 - 26.11.2020
Organizer
Royal Microscopical Society
