To main content

Cross-sectional carrier lifetime profiling and deep level monitoring in silicon carbide films exhibiting variable carbon vacancy concentrations

Category

Academic lecture

Client

  • Research Council of Norway (RCN) / 274742

Language

English

Author(s)

  • Augustinas Galeckas
  • Robert Michael Karsthof
  • Kingsly Gana
  • Angela Kok
  • Marianne Etzelmüller Bathen
  • Lasse Vines
  • Andrej Kuznetsov

Affiliation

  • University of Oslo
  • Unknown
  • SINTEF Digital / Smart Sensors and Microsystems

Presented at

The 4th International Conference on Radiation and Emission in Materials

Place

Pattaya

Date

06.04.2022 - 08.04.2022

Year

2022

View this publication at Cristin