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Tuning of Resist slope for RF MEMS with hard baking parameters

Category

Academic chapter/article/Conference paper

Language

English

Author(s)

  • Shimul Chandra Saha
  • Håkon Sagberg
  • Geir uri Jensen
  • Trond Sæther

Affiliation

  • Norwegian University of Science and Technology
  • Unknown
  • SINTEF

Year

2006

Publisher

International Microprocess and Nanotechnology Conference (MNC)

Book

Proceedings of the 19th International Microprocess and Nanotechnology Conference (MNC 2006

ISBN

4-9902472-3-X

View this publication at Cristin