Benefit of Microscopic Diffusion Measurement for the Characterization of Nanoporous Materials

Author(s)

• J. Kärger
• J. Caro
• P. Cool
• M.-O. Coppens
• D. Jones
• F. Kapteijn
• F. Rodríguez-Reinoso
• Michael Wilhelm Stöcker
• D. Theodorou
• E.F. Vansant
• J. Weitkamp

Affiliation

• University of Leipzig
• Gottfried Wilhelm Leibniz Universität Hannover
• University of Antwerp
• Delft University of Technology
• Rensselaer Polytechnic Institute
• National Center for Scientific Research
• University of Alicante
• SINTEF Industry / Process Technology
• National Technical University of Athens
• University of Stuttgart

Issue

10

DOI