Texture characterization of quartz defects by combinding EPMA-cathodoluminescence and SEM-electron back scattering diffraction techniques
Category
Poster
Language
English
Author(s)
- Bjørn Eske Sørensen
- Morten Peder Raanes
- Yingda Yu
- Jarle Hjelen
- Wilhelm Dall
Affiliation
- Norwegian University of Science and Technology
- SINTEF Industry / Metal Production and Processing
Presented at
15th European Microscopy Congress
Place
Manchester, UK
Date
16.09.2012 - 21.09.2012
Organizer
RMS IFSM
