To main content

DEVELOPMENT OF TOOL FOR FAST QUANTITATIVE CHARACTERIZATION OF DISLOCATION DENSITY ON ETCHED WAFERS

Category

Poster

Language

English

Author(s)

Affiliation

  • Norwegian University of Science and Technology
  • Unknown
  • SINTEF Industry / Sustainable Energy Technology
  • SINTEF Industry / Metal Production and Processing

Presented at

27th European Photovoltaic Solar Energy Conference

Place

Frankfurt

Date

24.09.2012 - 28.09.2012

Organizer

WIP-Munich

Year

2012

View this publication at Cristin