The instrument is powerful, and yet light and handy to provide an outstanding performance for especially lightweight elements when operated correctly.

This insturment uses the non-destructive XRF (X-ray fluorescence) technique, where the surface of a sample is bombarded with X-rays to emit secondary X-rays, characteristic to the elements on the surface. These signals are detected and processed to supply the composition of the sample surface on the screen or a connected computer within minutes.

Field of use:

• Quick identification of the composition on sample surfaces.
• Broad range of materials with a single analyser with very low detection limits.
• Detects all elements between (and including) Mg and U in the periodic table.

Complimentary equipment:

• May connect to a computer to easier automatize and remote control the analysis.
• Comes with a scaffold as well as a sample chamber.