Abstract
Several new methods for characterization of nano structrued materials prepared by severe plastic deformation, 3D-EBSD, 3D-atom probe tomography and TEM-based EBSD are introduced. Some applicaiton examples are given.
New Characterization methods for SPD nanostructured materials--invited talk
Category
Academic lecture
Language
English
Author(s)
- Yanjun Li
Affiliation
- SINTEF Industry / Materials and Nanotechnology
Presented at
NTNU, Nano_SPD workshop
Place
Kristiansund, Norway
Date
14.12.2010 - 15.12.2010
Organizer
Department of Materials Science and Engineering, NTNU
