Bandgap measurement of high refractive index materials by off-axis EELS
Category
Academic article
Client
- Research Council of Norway (RCN) / 197405
- Research Council of Norway (RCN) / 228956
Language
English
Author(s)
- Maryam Vatanparast
- Ricardo Egoavil
- Turid Worren Reenaas
- Johan Verbeeck
- Randi Holmestad
- Per Erik Vullum
Affiliation
- Norwegian University of Science and Technology
- University of Antwerp
- SINTEF Industry / Materials and Nanotechnology
Date
19.06.2017
Year
2017Published in
Ultramicroscopy
ISSN
0304-3991
Publisher
Elsevier
Volume
182
Page(s)
92 - 98