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Electrons and ions –use cases like FIB-SEM tomography and TEM lamellae

Category

Academic lecture

Language

English

Author(s)

Affiliation

  • Norwegian University of Science and Technology
  • SINTEF Industry / Materials and Nanotechnology
  • Unknown

Presented at

Nordic Nanolab User Meeting (NNUM)

Date

03.05.2024 - 04.05.2024

Year

2024

View this publication at Cristin