X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering
Category
Academic article
Language
English
Author(s)
- Ingvild Julie Thue Jensen
- Spyridon Diplas
- Ole Martin Løvvik
- J Watts
- S Hinder
- H Schreuders
- B Dam
Affiliation
- University of Oslo
- Unknown
- SINTEF
- University of Surrey
- Delft University of Technology
Year
2010Published in
Surface and Interface Analysis
ISSN
0142-2421
Volume
42
Issue
6-7
Page(s)
1140 - 1143